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Applied Physics A: Materials Science and Processing

Volumn 70, Issue 3, 2000, Pages 293-296

Structural and optical characterization of PLT thin films prepared by a sol-gel process

(3) Zhou, Q F a Chan, H L W a Choy, C L a

a HONG KONG POLYTECHNIC UNIVERSITY (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLIZATION; DIFFERENTIAL THERMAL ANALYSIS; INFRARED SPECTROSCOPY; LANTHANUM; LEAD COMPOUNDS; QUARTZ; SOL-GELS; SUBSTRATES; SURFACES; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

FUSED QUARTZ; LANTHANUM MODIFIED LEAD TITANATE;

THIN FILMS;

EID: 0034156318 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390050049 Document Type: Article

Times cited : (13)

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