Atomic-scale roughness effect on capillary force in atomic force microscopy

Journal of Physical Chemistry B

Volumn 110, Issue 2, 2006, Pages 659-662

  Jang, Joonkyung ^a   Ratner, M A ^b   Schatz, George C ^b  

^a Pusan National University   (South Korea)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; MONTE CARLO METHODS; SILICON NITRIDE; SURFACE ROUGHNESS; WATER;

CAPILLARY FORCES; LATTICE GAS MODEL; MICA SURFACE;

CAPILLARITY;

EID: 31544446302     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp056554b     Document Type: Article

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