Using normal approximation on testing and determining sample size for Cpk

Journal of the Chinese Institute of Industrial Engineers

Volumn 23, Issue 1, 2006, Pages 1-11

  Lin, Hung Chin ^a  

^a VANUNG UNIVERSITY   (Taiwan)

Author keywords

Critical value; Hamaker's approximation; Non central t distribution; Power; Process capability indices

Indexed keywords

COMPUTATIONAL METHODS; DECISION MAKING; ERROR ANALYSIS; PROCESS ENGINEERING; PRODUCT DEVELOPMENT; SAMPLING;

CRITICAL VALUE; HAMAKER'S APPROXIMATION; NON-CENTRAL T DISTRIBUTION; POWER; PROCESS CAPABILITY INDICES;

APPROXIMATION THEORY;

EID: 31544444419     PISSN: 10170669     EISSN: 21517606     Source Type: Journal    
DOI: 10.1080/10170660609508991     Document Type: Article

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