On a Comparison of the Efficacy of Various Approximations of the Critical Values for Tests on the Process Capability Indices CPL, CPU, and Cpk

Communications in Statistics Part B: Simulation and Computation

Volumn 32, Issue 4, 2003, Pages 1249-1264

  Perakis, Michael ^a   Xekalaki, Evdokia ^a,b  

^a ATHENS UNIVERSITY OF ECONOMICS AND BUSINESS   (Greece)

^b TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

Approximation; Critical value; Non central t distribution; Percentage point; Process capability indices; Tests of hypotheses

Indexed keywords

EID: 0242319681     PISSN: 03610918     EISSN: None     Source Type: Journal    
DOI: 10.1081/SAC-120023888     Document Type: Article

References (19)