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Volumn 52, Issue 16, 2005, Pages 2233-2243
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Quantum-correlation metrology with biphotons: Where is the limit?
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Author keywords
[No Author keywords available]
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Indexed keywords
INVERSE WIDTH;
OPTICAL SPECTRUM;
QUANTUM OPTICAL METROLOGY;
OPTICAL PROPERTIES;
OPTIMIZATION;
PHOTONS;
SPECTRUM ANALYSIS;
QUANTUM THEORY;
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EID: 31444450912
PISSN: 09500340
EISSN: 13623044
Source Type: Journal
DOI: 10.1080/09500340500275827 Document Type: Conference Paper |
Times cited : (18)
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References (22)
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