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Volumn 52, Issue 1, 1999, Pages 41-46

Correlated-photon metrology without absolute standards

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CORRELATION DETECTORS; CRYSTALS; INFRARED RADIATION; LIGHT POLARIZATION; LIGHT SOURCES; OPTICAL CORRELATION; OPTICAL VARIABLES MEASUREMENT; OPTICALLY PUMPED LASERS; PARAMETRIC AMPLIFIERS; QUANTUM EFFICIENCY; STANDARDS;

EID: 0032613362     PISSN: 00319228     EISSN: None     Source Type: Trade Journal    
DOI: 10.1063/1.882570     Document Type: Article
Times cited : (120)

References (17)
  • 5
    • 0022890217 scopus 로고
    • Lauer Radar Technology and Applications, J. M. Cruickshank, R. C. Harney, eds., International Society Of Optical Engineering, Bellingham, Washington
    • S. R. Bowman, Y. H. Shih, C. O. Alley, in Lauer Radar Technology and Applications, J. M. Cruickshank, R. C. Harney, eds., SPIE Conf. Proc. No. 663, International Society Of Optical Engineering, Bellingham, Washington (1986), p. 24.
    • (1986) SPIE Conf. Proc. No. 663 , vol.663 , pp. 24
    • Bowman, S.R.1    Shih, Y.H.2    Alley, C.O.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.