Dimer reference embedded atom method (DR-EAM) and its application to vacancy formation energy of FCC metals

Yosetsu Gakkai Ronbunshu/Quarterly Journal of the Japan Welding Society

Volumn 23, Issue 4, 2005, Pages 509-514

  Yin, Yingchen ^a   Takahashi, Kunio ^a   Yuan, Xiaoying ^b   Onzawa, Tadao ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b Advance Soft Corporation   (Japan)

Author keywords

Diatomic molecules; Diffusion phenomena; Embedded atom method; Micro joining; Reference structure; Vacancy formation energy

Indexed keywords

DIATOMIC MOLECULES; DIFFUSION PHENOMENA; EMBEDDED ATOM METHOD; MICRO JOINING; REFERENCE STRUCTURE;

ATOMS; DIFFUSION; ELECTRONIC DENSITY OF STATES; MOLECULAR STRUCTURE; PARAMETER ESTIMATION; SURFACE PROPERTIES;

DIMERS;

EID: 31444447532     PISSN: 02884771     EISSN: None     Source Type: Journal    
DOI: 10.2207/qjjws.23.509     Document Type: Article

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