Ab initio structure determination using dispersive differences from multiple-wavelength synchrotron-radiation powder diffraction data

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 61, Issue 6, 2005, Pages 568-574

  Helliwell, John R ^a   Helliwell, Madeleine ^a   Jones, Richard H ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b KEELE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 31444443271     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S010876730503237X     Document Type: Article

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