-
2
-
-
36449002730
-
-
Collins, S. P., Cernik, R. J., Pattison, P., Bell, A. T. M. & Fitch, A. N. (1992). Rev. Sci. Instrum. 63, 1013-1014.
-
(1992)
Rev. Sci. Instrum.
, vol.63
, pp. 1013-1014
-
-
Collins, S.P.1
Cernik, R.J.2
Pattison, P.3
Bell, A.T.M.4
Fitch, A.N.5
-
3
-
-
0001589990
-
-
National Institute of Standards and Technology Special Publication 846, edited by E. O. Prince & J. K. Stalick. Washington: US Department of Commerce
-
Le Bail, A. (1992). Accuracy in Powder Diffraction II, National Institute of Standards and Technology Special Publication 846, edited by E. O. Prince & J. K. Stalick, p. 213. Washington: US Department of Commerce.
-
(1992)
Accuracy in Powder Diffraction II
, pp. 213
-
-
Le Bail, A.1
-
4
-
-
33749198774
-
-
MacLean, E. J., Millington, H. F. F., Neild, A. A. & Tang, C. C. (2000). Mater. Sci. Forum, 321/324, 212-217.
-
(2000)
Mater. Sci. Forum
, vol.321-324
, pp. 212-217
-
-
Maclean, E.J.1
Millington, H.F.F.2
Neild, A.A.3
Tang, C.C.4
-
5
-
-
0345418291
-
-
Daresbury Preprint DL/CSE/P29E. Daresbury Laboratory, Daresbury, Warrington WA4 4AD, UK. Dubna, Russia, June 1994
-
Miller, M. C., Ackroyd, K. S. & Oszlanyi, G. (1994). Daresbury Preprint DL/CSE/P29E. Daresbury Laboratory, Daresbury, Warrington WA4 4AD, UK. (Presented at the 8th ESONE International Conference on Real-Time Data, Dubna, Russia, June 1994.)
-
(1994)
8th ESONE International Conference on Real-Time Data
-
-
Miller, M.C.1
Ackroyd, K.S.2
Oszlanyi, G.3
-
6
-
-
0344124566
-
-
Miller, M. C. Oszlanyi, G., Ackroyd, K. S., Marshall, C., Collins, S. P., Laundy, D. & Cernik, R. J. (1998). J. Appl. Cryst. 31, 972-973.
-
(1998)
J. Appl. Cryst.
, vol.31
, pp. 972-973
-
-
Miller, M.C.1
Oszlanyi, G.2
Ackroyd, K.S.3
Marshall, C.4
Collins, S.P.5
Laundy, D.6
Cernik, R.J.7
-
7
-
-
0344124564
-
-
(1992). Daresbury Preprint DL/Sci/TM86E. Daresbury Laboratory, Daresbury, Warrington WA4 4AD, UK
-
Oszlanyi, G. & Miller, M. C. (1992). Daresbury Preprint DL/Sci/TM86E. Daresbury Laboratory, Daresbury, Warrington WA4 4AD, UK.
-
-
-
Oszlanyi, G.1
Miller, M.C.2
-
8
-
-
0345418290
-
-
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
-
Rasberry, R. D. (1987). Certificate of Analysis: SRM 640b, Silicon Powder 2θ/d-Spacing Standard. National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
-
(1987)
Certificate of Analysis: SRM 640b, Silicon Powder 2θ/d-Spacing Standard
-
-
Rasberry, R.D.1
|