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Volumn 63, Issue 1, 2004, Pages 165-173
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Characterization of porous materials by small-angle scattering
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Author keywords
Ceramics; Multiple scattering; Porous medium; Porous silicon; Rocks; Small angle scattering
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Indexed keywords
CERAMIC MATERIALS;
DEGRADATION;
MICROELECTRONICS;
NEUTRON SCATTERING;
NONDESTRUCTIVE EXAMINATION;
STIFFNESS MATRIX;
SUBSTRATES;
THERMAL CONDUCTIVITY;
X RAY SCATTERING;
MULTIPLE SCATTERING;
POROUS MEDIUM;
SMALL-ANGLE SCATTERING;
POROUS SILICON;
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EID: 3142776156
PISSN: 03044289
EISSN: None
Source Type: Journal
DOI: 10.1007/BF02704063 Document Type: Conference Paper |
Times cited : (11)
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References (13)
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