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Journal of Materials Science: Materials in Electronics

Volumn 15, Issue 7, 2004, Pages 401-410

An empirical density of states and joint density of states analysis of hydrogenated amorphous silicon: A review

(1) O'Leary, Stephen Karrer a

a UNIVERSITY OF REGINA (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; DIELECTRIC PROPERTIES; ELECTRONIC DENSITY OF STATES; HYDROGENATION; LIGHT ABSORPTION; MATHEMATICAL MODELS; MATRIX ALGEBRA; OPTICAL PROPERTIES; SEMICONDUCTING SILICON COMPOUNDS; SPECTRUM ANALYSIS;

DIELECTRIC FUNCTION; DIPOLE MATRIX ELEMENT; HYDROGENATED AMORPHOUS SILICON; OPTICAL ABSORPTION SPECTRUM; VALENCE BAND;

AMORPHOUS SILICON;

EID: 3142775728 PISSN: 09574522 EISSN: None Source Type: Journal
DOI: 10.1023/B:JMSE.0000031593.62734.3a Document Type: Review

Times cited : (36)

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