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Volumn 222, Issue 3-4, 2004, Pages 659-666
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X-ray beam characteristics on MPW6.2 at the SRS
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Author keywords
Sagittally focusing monochromator; Synchrotron instrumentation; X ray beam characteristics; X ray optics
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Indexed keywords
ABSORPTION SPECTROSCOPY;
DIFFRACTOMETERS;
MONOCHROMATORS;
SYNCHROTRON RADIATION;
X RAY ANALYSIS;
X RAY POWDER DIFFRACTION;
X RAY SCATTERING;
SAGITTALLY FOCUSING MONOCHROMATOR;
SYNCHROTRON INSTRUMENTATION;
X-RAY BEAM CHARACTERISTICS;
X-RAY OPTICS;
ION BEAMS;
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EID: 3142766049
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2004.03.010 Document Type: Article |
Times cited : (17)
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References (12)
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