The new materials processing beamline at the SRS Daresbury, MPW6.2

Journal of Synchrotron Radiation

Volumn 11, Issue 2, 2004, Pages 163-170

  Cernik, R J ^a,b,c   Barnes, P ^b   Bushnell Wye, G ^a   Dent, A J ^a,g   Diakun, G P ^a   Flaherty, J V ^a   Greaves, G N ^d   Heeley, E L ^e   Helsby, W ^a   Jacques, S D M ^b   Kay, J ^a   Rayment, T ^f   Ryan, A ^e   Tang, C C ^a   Terrill, N J ^a  

^a DARESBURY LABORATORY   (United Kingdom)

^b UNIVERSITY OF LONDON   (United Kingdom)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

^d ABERYSTWYTH UNIVERSITY   (United Kingdom)

^e UNIVERSITY OF SHEFFIELD   (United Kingdom)

^f UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^g DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

Detector development; X ray instrumentation

Indexed keywords

COLLAGEN; COPOLYMERS; CRYSTALLIZATION; DECOMPOSITION; HYDRATION; LATTICE CONSTANTS; MATERIALS SCIENCE; OPTICAL RESOLVING POWER; SYNCHROTRON RADIATION; X RAY APPARATUS; X RAY DIFFRACTION ANALYSIS;

DETECTOR DEVELOPMENT; MATERIALS PROCESSING; SPINODAL DECOMPOSITION; X-RAY INSTRUMENTATION;

ENERGY DISPERSIVE SPECTROSCOPY;

MINERAL; POLYPROPYLENE;

ARTICLE; CHEMISTRY; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SYNCHROTRON; TRANSDUCER; UNITED KINGDOM; X RAY DIFFRACTION;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; GREAT BRITAIN; MATERIALS TESTING; MINERALS; POLYPROPYLENES; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SYNCHROTRONS; TRANSDUCERS; X-RAY DIFFRACTION;

EID: 3142749558     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049503027870     Document Type: Article

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