Mechanical properties of nanostructured amorphous metal multilayer thin films

Journal of Materials Research

Volumn 19, Issue 6, 2004, Pages 1840-1848

  Vella, J B ^a   Mann, A B ^b   Kung, H ^c   Chien, C L ^a   Weihs, T P ^a   Cammarata, R C ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

^b RUTGERS UNIVERSITY   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; COPPER ALLOYS; ELASTIC MODULI; ELECTRON DIFFRACTION; HARDNESS; INDENTATION; IRON ALLOYS; MULTILAYERS; NANOSTRUCTURED MATERIALS; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

BILAYER MATERIAL SYSTEMS; HARDNESS ENHANCEMENTS; NANOINDENTATION; RULE MIXTURES PREDICTIONS;

METALLIC FILMS;

EID: 3142755684     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2004.0248     Document Type: Article

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