Ferro-antiferromagnetic exchange interaction in the composite (epitaxial) nanostructures Co/CoO

Journal of Magnetism and Magnetic Materials

Volumn 279, Issue 2-3, 2004, Pages 235-240

  Mushailov, E S ^a   Vasiliev, B V ^b  

^a KIRENSKY INSTITUTE OF PHYSICS   (Russian Federation)

^b Astaf'ev Krasnoyarsk State Pedagogical University   (Russian Federation)

Author keywords

Exchange anisotropy; Interface; Thin film

Indexed keywords

ANISOTROPY; ANTIFERROMAGNETISM; COBALT; COBALT COMPOUNDS; COMPOSITE MATERIALS; EPITAXIAL GROWTH; EVAPORATION; INTERFACES (MATERIALS); MAGNETIC HYSTERESIS; THIN FILMS;

EXCHANGE ANISOTROPY; MONOCRYSTALS; SURFACE ENERGY DENSITY; THERMAL EVAPORATION;

NANOSTRUCTURED MATERIALS;

EID: 3142732949     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2004.01.084     Document Type: Article

References (33)

1. Meiklejon W.H., Bean C.P. Phys. Rev. 102:1956;1413.
2. Nogués J., Schuller I.K. J. Magn. Magn. Mater. 192:1999;203.
3. Bercowitz A.E., Takano K. J. Magn. Magn. Mater. 200:1999;552.
4. Peng D.L., Sumiyama K., Hihara T., et al. Phys. Rev. B. 61:2000;3103.
5. Matsuyama H., Haginova C., Koike K. Phys. Rev. Lett. 85:2000;646.
6. Nogués J., Leighton C., Schuller I.K. Phys. Rev. B. 6:2000;1315.
7. Leighton C., Nogués J., Jönsson-Åkerman B.J., et al. Phys. Rev. Lett. 84:2000;3466.
8. Nogués J., Morellon L., Leighton C., et al. Phys. Rev. B. 61:2000;R6455.
9. Parker F.T., Takano K., Berkowitz A.E. Phys. Rev. B. 61:2000;R866.
10. Thomas L., Kellok A.J., Parkin S.S. J. Appl. Phys. 87:2000;5061.
11. Mewes T., Roos B.F.P., Demokritov S.O., et al. J. Appl. Phys. 87:2000;5064.
12. Gruyters M., Riegel D. J. Appl. Phys. 88:2000;6610.
13. Levchenco V.D., Morozov A.I., Sigov A.S. Lett. JETP. 71:2000;544.
14. Liu K., Zhou S.M., Chien C.L., et al. J. Appl. Phys. 87:2000;5052.
15. Nikitenko V.I., Gornakov V.S., Shapiro A.J., et al. Phys. Rev. Lett. 84:2000;765.
16. Tong H.C., Qian C., Miloslavsky L., et al. J. Magn. Magn. Mater. 209:2000;56.
17. Zhou S.M., Chien C.L. Phys. Rev. B. 63:2001;104406.
18. Ohlag H., Scholl A., Nolting F., et al. Phys. Rev. Lett. 86:2001;2878.
19. M.-T. Lin, C.H. Ho, C.-R. Chang, et al., B 63 (2001) R100404.
20. Gruyters M., Riegel D. Phys. Rev. B. 63:2001;052401.
21. Levchenco V.D., Morozov A.I., Sigov A.S. Phys. Stat. Sol. 44:2002;128.
22. Liu Z.Y., Adenwalla S. J. Appl. Phys. 93:2003;2091.
23. Néel L. Compt. Rend. 228:1949;664.
24. Glazer A.A., Potapov A.P., Tagirov R.I., et al. Phys. Stat. Sol. 16:1966;745.
25. Schlenker C. Phys. Stat. Sol. 28:1968;507.
26. Falcomer E., Charap S.H. J. Appl. Phys. 43:1972;4190.
27. Nishioka K., Hou C., Fujiwara H., et al. J. Appl. Phys. 80:1966;4528.
28. Fujikata J., Hayashi K., Yamamoto H., et al. J. Appl. Phys. 83:1998;7210.
29. van der Heijden P.A.A., Maas T.F.M.M., Kools J.C.S., et al. J. Appl. Phys. 83:1998;7207.
30. van der Heijden P.A.A., Maas T.F.M.M., de Jonge W.J.M., et al. Appl. Phys. Lett. 72:1998;492.
31. Mushailov E.S., Maltsev V.K., Turpanov I.A., et al. J. Magn. Magn. Mater. 138:1994;207.
32. Mushailov E.S., Kim P.D., Turpanov I.A., et al. Lett. JETP. 71:2000;285.
33. Rushbrooke G.S., Wood P.J. Molecular Phys. 1:1958;257.