Influences on relaxation of exchange biasing in NiO/Ni66Co 18Fe16 bilayers

Journal of Applied Physics

Volumn 83, Issue 11, 1998, Pages 7207-7209

  Van Der Heijden, P A A ^a,c   Maas, T F M M ^a   Kools, J C S ^b,d   Roozeboom, F ^b   Van Der Zaag, P J ^b   De Jonge, W J M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

^c AMC   (United States)

^d CVC Products   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001753782     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367549     Document Type: Article

References (12)

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