Effect of some metallic impurities on the density of localized states in a-Se80Te20 thin films

Vacuum

Volumn 75, Issue 4, 2004, Pages 313-320

  Singh, S P ^a   Kumar, S ^a   Kumar, A ^b  

^a CHRIST CHURCH COLLEGE   (India)

^b HARCOURT BUTLER TECHNOLOGICAL INSTITUTE   (India)

Author keywords

Chalcogenide glasses; DOS; SCLC; Thin films

Indexed keywords

ELECTRIC CONDUCTIVITY; EVAPORATION; FERMI LEVEL; GLASS; IMPURITIES; THIN FILMS; VACUUM;

CHALCOGENIDE GLASSES; DENSITY OF DEFECT STATES (DOS); SPACE CHARGED LIMITED CONDUCTION (SCLC);

TELLURIUM COMPOUNDS;

EID: 3142730763     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2004.04.002     Document Type: Article

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