Dielectric relaxation in glassy Se80-xTe20Gex

Journal of Materials Science

Volumn 35, Issue 4, 2000, Pages 1017-1021

  Goel, D K ^a   Singh, C P ^a   Shukla, R K ^b   Kumar, A ^b  

^a VSSD College Kanpur   (India)

^b HARCOURT BUTLER TECHNOLOGICAL INSTITUTE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; DIELECTRIC LOSSES; DIELECTRIC RELAXATION; GLASS; PERMITTIVITY MEASUREMENT;

AUDIO FREQUENCY RANGE;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 0033909175     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004779231257     Document Type: Article

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