Growth of fully doped Hg1-xCdxTe heterostructures using a novel iodine doping source to achieve improved device performance at elevated temperatures

Journal of Electronic Materials

Volumn 25, Issue 8, 1996, Pages 1276-1285

  Maxey, C D ^a   Jones, C L ^a   Metcalfe, N E ^a   Catchpole, R ^a   Houlton, M R ^b   White, A M ^b   Gordon, N T ^b   Elliott, C T ^b  

^a GEC Marconi Infra Red Limited   (United Kingdom)

^b DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

Diffusion; Doping; Heterojunctions; HgCdTe; Metalorganic vapor phase epitaxy (MOVPE)

Indexed keywords

EID: 3142721323     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02655020     Document Type: Article

References (37)

1. H.R. Vydyanath, J.A. Ellsworth and C.M. Devany, J. Electron. Mater. 16, 13 (1987).
2. P. Capper, C.D. Maxey, P.A.C. Whiffin and B.C. Easton, J. Cryst. Growth 97, 833 (1989).
3. C.D. Maxey, I.G. Gale, J.B. Clegg and P.A.C. Whiffin, Semicond. Sci. Technol. 8, S183 (1993).
4. D.D. Edwall, L.O. Bubulac and E.R. Gertner, J. Vac. Sci. Technol. B 10, 1423 (1992).
5. V. Rao, H. Ehsani, I.B. Bhat, M. Kestigian, R. Starr, M.H. Weiler and M.B. Reine, J. Electron. Mater. 24, 5 (1995).
6. P. Mitra, T.R. Schimart, F.C. Case, S.L. Barnes, M.B. Reine, R. Starr, M.H. Weiler and M. Kestigian, J. Electron. Mater. 24, 1077 (1995).
7. H.R. Vydyanath and F.A. Kroger, J. Electron. Mater. 11, 1 (1982).
8. EMIS Datareview Series #10, ed. P. Capper (1994).
9. B.C. Easton, C.D. Maxey, P.A.C. Whiffin, J.A. Roberts, I.G. Gale, F. Grainger and P. Capper, J. Vac. Sci. Technol. B 9, 1682 (1991).
10. C.D. Maxey, P.A.C. Whiffin and B.C. Easton, Semicond. Sci. Technol. 6 c26 (1991).
11. P. Mitra, Y.L. Tyan, T.R. Schimert and F.C. Case, Appl. Phys. Lett. 65, 2 (1994).
12. S. Murikami, T. Okamoto, K. Maruyama and H. Takigawa, Appl. Phys. Lett. 63, 899 (1993).
13. P. Mitra, T.R. Schimert, F.C. Case, Y.L. Tyan, M. Kestigian, R. Starr, M.H. Weiler and M.B. Reine, SPIE 2228, 96 (1994).
14. M.B. Reine, P.W. Norton, R. Starr, M.H. Weiler, M. Kestigian, P. Mitra, T.R. Schimert, F.C. Case, I.B. Bhat, H. Ehsani and V. Rao, J. Electron Mater. 24, 669 (1995).
15. C.T. Elliott, N.T. Gordon, R.S. Hall, T.J. Phillips, C.L. Jones, B.E. Matthews, C.D. Maxey and N.E. Metcalfe, SPIE 2269, 648 (1994).
16. I.M. Baker, G.J. Crimes, M.D. Jenner, J.E. Parsons, R.A. Ballinghall and C.T. Elliott, Proc. 4th Conf. Adv. IR. Detector and Systems IEE 78 (1990).
17. A.M. White, Infrared Phys. 27, 6, 361 (1987).
18. L. Smith and J. Thompson, J. Matt. Lett. 7, 416 (1989).
19. P. Capper, C.D. Maxey, P.A.C. Whiffin and B.C. Easton, J. Cryst. Growth 96, 519 (1989).
20. A. Wasenzcuk, A. Willoughby, P. Mackett, E. O'Keefe, P. Capper and C.D. Maxey, Proc. 1995 II/VI Conf. Edinburgh (to be published).
21. J. Tunnicliffe, S.J.C. Irvine, O.D. Dosser and J.B. Mullin, J. Cryst. Growth 79, 935 (1984).
22. I. Gale, J.B. Clegg, P. Capper, C.D. Maxey, P. Mackett and E. O'Keefe, Adv. Mat. for Optics and Electonics 5, 2, 53 (1995).
23. EMIS Datareview Series #10, A5.10, 188 (1994).
24. Handbook of Chemistry and Physics, 54th ed. D105-108 (1964).
25. J.S. Gough, M.R. Houlton, S.J.C. Irvine, N. Shaw, M.L. Young and A. Royle, Mater. Lett. 10, 393 (1991).
26. J. Geiss, J.E. Hails, A. Graham, G. Blackmore, M.R. Houlton, J. Newey, M.L. Young, M.G. Astles, W. Bell and D.J. Cole-Hamilton, J. Electron. Mater. 24 (9), 1151 (1995).
27. C.D. Maxey, P. Capper, P.A.C. Whiffin, B.C. Easton and A. Harker, Mater. Lett. 8, 835 (1989).
28. J. Malzbender, E.D. Jones, J.B. Mullin and N. Shaw, J. Electron. Mater. 24, 1225 (1995).
29. L.O. Bubulac, S.J.C. Irvine, E.R. Gertner, J. Bajaj, W.P. Lin and R. Zucca, Semicond. Sci. Tecnol. 8, S270 (1993).
30. C.T. Elliott, N. Gordon, R.S. Hall, T.J. Phillips, A.M. White, C.L. Jones, C.D. Maxey and N.E. Metcalfe, J. Electron. Mater. 25, 1139 (1996).
31. C.T. Elliott, N. Gordon, T.J. Phillips, H. Steen, D.J. Wilson, C.L. Jones, C.D. Maxey and N.E. Metcalfe, J. Electron. Mater. 25, 1146 (1996).
32. T.J. Phillips and N.T. Gordon. J. Electron. Mater. 25, 1151 (1996).
33. D.D. Edwall, L.O. Bubulac and E.R. Gertner, J. Vac. Sci. Technol. B 10, 4, 1423 (1992).
34. L.J. Kozlowski, W.V. McLevige, S.A. Cabelli, A.H.B. Vanderwyck, D.E. Cooper, E.R. Blazejewski, K. Vural and W.E. Tennent, Optical Eng. 33, 3 704 (1994).
35. R. Ciupa, A. Rogalski, J. Rutkowski and J. Piotrowski, Optical Eng. 33, 5 1434 (1994).
36. T. Ashley, A.B. Dean, C.T. Elliott, C.F. McConville, G.J. Pryce and C.R. Whitehouse, App. Phys. Lett. 59, 14, 1761 (1991).
37. C.L. Jones, B.E. Matthews, D.R. Purdy and N.B. Metcalfe, Semicond. Sci. Technol. 6, C110 (1991).