Atomic-scale negative differential conductance observed at B-Type surface steps on the Si(001)-2x1 surface

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 6 SUPPL. B, 1997, Pages 4013-4015

  Komura, Takuji ^a   Yoshimura, Masamichi ^b   Yao, Takafumi ^a,c  

^a TOHOKU UNIVERSITY   (Japan)

^b TOYOTA TECHNOLOGICAL INSTITUTE   (Japan)

^c JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

Author keywords

Local density of state; Negative differential conductance; Rebonded step; Scanning tunneling microscope; Scanning tunneling spectroscopy; Si

Indexed keywords

EID: 3142720039     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.4013     Document Type: Article

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