The influence of microstructure on compressive stress characteristics of the finemet-type nanocrystalline sensors

Journal of Optoelectronics and Advanced Materials

Volumn 5, Issue 3, 2003, Pages 705-708

  Szewczyk, R ^a   Bienkowski A ^b   Salach, J ^b   Fazakas, E ^b,c   Varga, L K ^c  

^a INDUSTRIAL RESEARCH INSTITUTE FOR AUTOMATION AND MEASUREMENTS PIAP   (Poland)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^c WIGNER RESEARCH CENTRE FOR PHYSICS   (Hungary)

Author keywords

Magnetoelastic sensors; Nanocrystalline magnetic alloys

Indexed keywords

ANNEALING; COMPRESSIVE STRESS; ELASTICITY; FREE ENERGY; MAGNETIC ANISOTROPY; MAGNETIC FIELDS; MAGNETIZATION; MICROSTRUCTURE; OPTICAL SENSORS; VOLUME FRACTION; X RAY POWDER DIFFRACTION;

FORCE SENSORS; MAGNETOCRYSTALLINE ANISOTROPY; MAGNETOELASTIC STRESSES;

NANOSTRUCTURED MATERIALS;

EID: 0346334241     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (6)

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4. A. Bieńkowski, R. Szewczyk, Patent Pending P-345758, 2001.
5. L. K. Varga et al., IEEE Trans. Magn. 37, 2229 (2001).
6. A. D. Crisan, J. M. LeBreton, O. Crisan, G. Filoti, J. Optoelectron, Adv. Mater. 5(3), 663 (2003).