Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 2003, Pages 125-128

  Nenadović, Nebojša ^a   Mijalković, Slobodan ^a   Nanver, L K ^a   Vandamme, Lode J K ^b   Schellevis, Hugo ^a   d'Alessandro, Vincenzo ^a   Slotboom, Jan W ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE MEASUREMENT; FREQUENCY DOMAIN ANALYSIS; IMPEDANCE MATCHING (ELECTRIC); SEMICONDUCTING GLASS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES;

LOW DISTORTION SIGNAL GENERATORS; MUTUAL THERMAL COUPLING IMPEDANCE; SELF HEATING THERMAL COUPLING IMPEDANCE; SILICON ON GLASS TEST STRUCTURES;

BIPOLAR TRANSISTORS;

EID: 1042266047     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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