Identifying Au-based Te alloys for optical data storage

Journal of Applied Physics

Volumn 95, Issue 12, 2004, Pages 7567-7572

  Wamwangi, D ^a   Detemple, R ^a   Woeltgens, H W ^a   Wuttig, M ^a   Zhang, X ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CRYSTALLIZATION; EVAPORATION; LASER ABLATION; MASS SPECTROMETERS; OPTICAL DATA STORAGE; PHASE SEPARATION; PHASE TRANSITIONS; PULSE WIDTH MODULATION; REFLECTOMETERS; SEMICONDUCTOR MATERIALS; SENSITIVITY ANALYSIS; SUPERCONDUCTING TRANSITION TEMPERATURE; THIN FILMS; X RAY DIFFRACTION;

COMPLETE ERASURE TIME (CET); TEMPERATURE-DEPENDENT SHEET RESISTANCE; VACUUM BASED SYNTHESIS; X-RAY REFLECTOMETRY (XRR);

TELLURIUM COMPOUNDS;

EID: 3142641531     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1736332     Document Type: Article

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