Profiled bar transmission gratings: Soft-x-ray calibration of new Kirchoff solutions

Applied Optics

Volumn 43, Issue 19, 2004, Pages 3772-3796

  Hettrick, Michael C ^a   Cuneo, Michael E ^b   Porter, John L ^b   Ruggles, Larry E ^b   Simpson, Walter W ^b   Vargas, Mark F ^b   Wenger, David F ^b  

^a Hettrick Scientific   (Japan)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CHARGE COUPLED DEVICES; ELECTRON BEAMS; MATHEMATICAL MODELS; PHOTONS; PLASMAS; X RAYS;

BAR TRANSMISSION GRATINGS; KIRCHOFF SOLUTIONS; PHOTON ENERGY;

DIFFRACTION GRATINGS;

EID: 3142567247     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.003772     Document Type: Article

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