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Volumn 41, Issue 25, 2002, Pages 5209-5217

X-ray absolute calibration of the time response of a silicon photodiode

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Indexed keywords


EID: 0036714495     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.005209     Document Type: Article
Times cited : (12)

References (13)
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  • 2
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    • Soft x-ray characterization of a silicon p-n photodiode using a laser produced plasma source
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  • 3
    • 0038096252 scopus 로고    scopus 로고
    • Photodiode Detectors
    • J. A. R. Samson and D. L. Ederer, eds. (Academic, San Diego
    • L. R. Canfield, “Photodiode Detectors,” in Vacuum Ultraviolet Spectroscopy II, J. A. R. Samson and D. L. Ederer, eds. (Academic, San Diego, 1998).
    • (1998) Vacuum Ultraviolet Spectroscopy II
    • Canfield, L.R.1
  • 4
    • 0000929254 scopus 로고
    • Upgrades and recent performance of the grating/crystal monochromator
    • J. C. Rife, H. R. Sadeghi, and W. R. Hunter, “Upgrades and recent performance of the grating/crystal monochromator,” Rev. Sci. Instrum. 60, 2064-2067 (1989).
    • (1989) Rev. Sci. Instrum. , vol.60 , pp. 2064-2067
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  • 5
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    • An ultrahigh vacuum reflectom-eter/goniometer for use with synchrotron radiation
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    • (1986) Nucl. Instrum. Methods A , vol.246 , pp. 465-468
    • Hunter, W.R.1    Rife, J.C.2
  • 6
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    • Brookhaven National Laboratory publication BNL-52554 (Brookhaven National Laboratory, Brookhaven, N.Y
    • E. Z. Rothman, ed., National Synchrotron Light Source Activity Report, Brookhaven National Laboratory publication BNL-52554 (Brookhaven National Laboratory, Brookhaven, N.Y., 1998), pp. 4 -9.
    • (1998) National Synchrotron Light Source Activity Report
    • Rothman, E.Z.1
  • 9
    • 0030289866 scopus 로고    scopus 로고
    • Measurement of the mean electron-hole pair creation energy in crystalline silicon for photons in the 50-1500 eV spectral range
    • F. Scholze, H. Rabus, and G. Ulm, “Measurement of the mean electron-hole pair creation energy in crystalline silicon for photons in the 50-1500 eV spectral range,” Appl. Phys. Lett. 69, 2974-2976 (1996).
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  • 10
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    • Responsivity model for a silicon photodiode in the extreme ultraviolet
    • S. Fineschi, C. Korendyke, O. Siegmund, and B. Woodgate, eds., Proc. SPIE 4139
    • J. F. Seely, “Responsivity model for a silicon photodiode in the extreme ultraviolet,” in Instrumentation for UV/EUV Astronomy and Solar Missions, S. Fineschi, C. Korendyke, O. Siegmund, and B. Woodgate, eds., Proc. SPIE 4139, 1-7 (2000).
    • (2000) Instrumentation for UV/EUV Astronomy and Solar Missions , pp. 1-7
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  • 11
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    • X-ray interactions: Photoabsorption, scattering, transmission, and reflection at E = 50-30,000 eV, Z = 1-92
    • B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E = 50-30,000 eV, Z = 1-92,” At. Data Nucl. Data Tables 54, 181-342 (1993).
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  • 12
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    • Silicon (Si)
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    • Edwards, D.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.