Semiconductor properties of Cu-based delafossites revealed by an electric field gradient study

Journal of Physics Condensed Matter

Volumn 18, Issue 5, 2006, Pages 1619-1628

  Lalic M V ^a   Mestnik Filho, J ^b  

^a FEDERAL UNIVERSITY OF SERGIPE   (Brazil)

^b INSTITUTO DE PESQUISAS ENERGÉTICAS E NUCLEARES   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

BORON; COPPER; COPPER COMPOUNDS; CRYSTAL IMPURITIES; ELECTRIC FIELDS;

DELAFOSSITES; ELECTRIC FIELD GRADIENT (EFG);

SEMICONDUCTOR MATERIALS;

EID: 31344432722     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/18/5/015     Document Type: Article

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