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Volumn 19, Issue 4, 2001, Pages 487-496

Screening of uranium particles by total-reflection x-ray fluorescence spectrometry for safeguards environmental sample analysis

Author keywords

Particles; Safeguards; SIMS; TXRF; Uranium

Indexed keywords


EID: 31244435222     PISSN: 07334680     EISSN: None     Source Type: Journal    
DOI: 10.1081/TMA-100107584     Document Type: Article
Times cited : (10)

References (10)
  • 1
    • 0032090927 scopus 로고    scopus 로고
    • Strengthening IAEA Safeguards through Environmental Sampling and Analysis
    • Donohue, D.L. Strengthening IAEA Safeguards Through Environmental Sampling and Analysis. J. Alloy Compounds 1998, 271-273, 11-18.
    • (1998) J. Alloy Compounds , vol.271-273 , pp. 11-18
    • Donohue, D.L.1
  • 3
    • 0007755178 scopus 로고
    • Single Particle Standards for Isotopic Measurements of Uranium by Secondary Ion Mass Spectrometry
    • Simons, D.S. Single Particle Standards for Isotopic Measurements of Uranium by Secondary Ion Mass Spectrometry. J. Trace Microprobe Tech. 1986, 4, 185-195.
    • (1986) J. Trace Microprobe Tech. , vol.4 , pp. 185-195
    • Simons, D.S.1
  • 5
    • 0001468433 scopus 로고
    • Grieken, R.V. Optimisation of Total-reflection X-ray Fluorescence for Aerosol Analysis
    • Injuk, J.; Grieken, R.V. Optimisation of Total-reflection X-ray Fluorescence for Aerosol Analysis. Spectrochim. Acta B 1995, 50, 1787-1803.
    • (1995) Spectrochim. Acta B , vol.50 , pp. 1787-1803
    • Injuk, J.1
  • 8
    • 2142658678 scopus 로고    scopus 로고
    • Niessner, R. Elemental Analysis of Airborne Dust Samples with TXRF: Comparison of Oxygen-plasma Ashing on Sapphire Carriers and Acid Digestion for Sample Preparation
    • Theisen, M.; Niessner, R. Elemental Analysis of Airborne Dust Samples with TXRF: Comparison of Oxygen-plasma Ashing on Sapphire Carriers and Acid Digestion for Sample Preparation. Fresenius J. Anal. Chem. 1999, 365, 332-337.
    • (1999) Fresenius J. Anal. Chem. , vol.365 , pp. 332-337
    • Theisen, M.1
  • 9
    • 0001563076 scopus 로고
    • Schwenke, H. Trace Element Analysis Using Total-reflection X-ray Fluorescence Spectrometry
    • Prange, A.; Schwenke, H. Trace Element Analysis Using Total-reflection X-ray Fluorescence Spectrometry. Adv. X-ray Anal. 1992, 35, 899-923.
    • (1992) Adv. X-ray Anal. , vol.35 , pp. 899-923
    • Prange, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.