Scanning anode field emission microscopy analysis for studies of planar cathodes

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 23, Issue 2, 2005, Pages 671-675

  Semet, V ^a   Mouton, R ^a   Binh, Vu Thien ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; ELECTRIC POTENTIAL; FIELD EMISSION MICROSCOPES; SCANNING; SURFACES;

MICROMETRIC PROXIMITY; PLANAR CATHODE SURFACES;

ANODES;

EID: 31144472610     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1857911     Document Type: Conference Paper

References (7)

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7. E. Durand, in Electrostatique et Magnetostatique, edited by, Masson, and, Cie, (Libraires de l'Academie de Medecine, Paris, 1953).