-
1
-
-
31044440255
-
-
edited by A. W.Czanderna, T. E.Madey, and C. J.Powell (Plenum, New York
-
J. H. Thomas, III, Surface Topology and Depth Profiling in Surface Analysis, edited by, A. W. Czanderna, T. E. Madey, and, C. J. Powell, (Plenum, New York, 1998), p. 1.
-
(1998)
Surface Topology and Depth Profiling in Surface Analysis
, pp. 1
-
-
Thomas Iii, J.H.1
-
3
-
-
84858518578
-
-
V. Crist, XPS-International Data Tables, LLC, 754 Leona Lane, Mountain View CA 94040 (http://www.xpsdata.com/).
-
-
-
Crist, V.1
-
5
-
-
3042631462
-
-
D.Briggs and J. T.Grant (IM Publications and SurfaceSpectra LTD, Chichester, UK
-
D. R. Baer, D. J. Gaspar, M. H. Engelhard, and A. S. Lea, in Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, edited by, D. Briggs, and, J. T. Grant, (IM Publications and SurfaceSpectra LTD, Chichester, UK, 2003), Chap.
-
(2003)
Surface Analysis by Auger and X-ray Photoelectron Spectroscopy
-
-
Baer, D.R.1
Gaspar, D.J.2
Engelhard, M.H.3
Lea, A.S.4
-
6
-
-
3042631462
-
-
D.Briggs and J. T.Grant (IM Publications and SurfaceSpectra Ltd., Chichester UK
-
D. R. Baer, M. H. Engelhard, A. S. Lea, and D. J. Gaspar, in Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, edited by, D. Briggs, and, J. T. Grant, (IM Publications and SurfaceSpectra Ltd., Chichester UK, 2003), Appendix F.
-
(2003)
Surface Analysis by Auger and X-ray Photoelectron Spectroscopy
-
-
Baer, D.R.1
Engelhard, M.H.2
Lea, A.S.3
Gaspar, D.J.4
-
10
-
-
0038427603
-
-
Organic Materials Group of Surface Analysis Society of Japan
-
T. Maruyama, N. Suzuki, H. Tohma, K. Miura, and Organic Materials Group of Surface Analysis Society of Japan, J. Surf. Anal. 6, 59 (1999).
-
(1999)
J. Surf. Anal.
, vol.6
, pp. 59
-
-
Maruyama, T.1
Suzuki, N.2
Tohma, H.3
Miura, K.4
-
12
-
-
31044456710
-
Sample Degradation during AES and XPS
-
D. R. Baer, M. H. Engelhard, and A. S. Lea, contributing editors " Sample Degradation During AES and XPS. " focused topical issue of Surf. Sci. Spectra 10, 47 (2003).
-
(2003)
Surf. Sci. Spectra
, vol.10
, pp. 47
-
-
Baer, D.R.1
Engelhard, M.H.2
Lea, A.S.3
-
13
-
-
31044450584
-
Beam damage of poly(vinyl chloride) [PVC] film as observed by X-ray photoelectron spectroscopy
-
M. H. Engelhard, A. Krishna, P. Kulkarni, C. Y. Lee, and D. R. Baer, " Beam damage of poly(vinyl chloride) [PVC] film as observed by X-ray photoelectron spectroscopy., " Surf. Sci. Spectra 10, 57 (2003).
-
(2003)
Surf. Sci. Spectra
, vol.10
, pp. 57
-
-
Engelhard, M.H.1
Krishna, A.2
Kulkarni, P.3
Lee, C.Y.4
Baer, D.R.5
-
14
-
-
31044450450
-
Electron beam damage in poly(vinyl chloride) and poly(acrylonitrile) as observed by Auger electron spectroscopy
-
A. S. Lea, M. H. Engelhard, and D. R. Baer, " Electron beam damage in poly(vinyl chloride) and poly(acrylonitrile) as observed by Auger electron spectroscopy., " Surf. Sci. Spectra 10, 67 (2003).
-
(2003)
Surf. Sci. Spectra
, vol.10
, pp. 67
-
-
Lea, A.S.1
Engelhard, M.H.2
Baer, D.R.3
-
16
-
-
31044439669
-
Beam damage of bulk poly(vinyl chloride) [PVC] as observed by x-ray photoelectron spectroscopy at 143 K, 303 K and 373 K
-
M. H. Engelhard, D. R. Baer, and A. S. Lea, " Beam damage of bulk poly(vinyl chloride) [PVC] as observed by x-ray photoelectron spectroscopy at 143 K, 303 K and 373 K., " Surf. Sci. Spectra 10, 101 (2003).
-
(2003)
Surf. Sci. Spectra
, vol.10
, pp. 101
-
-
Engelhard, M.H.1
Baer, D.R.2
Lea, A.S.3
-
17
-
-
0342732857
-
-
C. A. Kim, J. T. Kim, K. Lee, H. J. Choi, and M. S. John, Polymer 41, 7611 (2000).
-
(2000)
Polymer
, vol.41
, pp. 7611
-
-
Kim, C.A.1
Kim, J.T.2
Lee, K.3
Choi, H.J.4
John, M.S.5
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