Profilometry using a frequency-shifted feedback laser

2005 Conference on Lasers and Electro-Optics, CLEO

Volumn 3, Issue , 2005, Pages 1757-1759

  Ndiaye, Cheikh ^a   Hara, Takefumi ^a   Ito, Hiromasa ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY SHIFT KEYING; LASERS; OPTICAL PROPERTIES;

DOMAIN REFLECTOMETRY; OPTICAL FREQUENCY; OPTICAL PROFILOMETRY;

PROFILOMETRY;

EID: 30944449862     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/cleo.2005.202265     Document Type: Conference Paper

References (4)

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2. D. S. Mehta et al. Appl. Opt. 41, 3874-3885 (2002).
3. M. Kinoshita et al. Appl. Opt. 38, 3874-3885 (2002).
4. K. Nakamura, T. Hara, M. Yoshida, H. Ito, IEEE J. Quantum Electron. 36(3), 305 (2000).