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Volumn 243, Issue 2, 2006, Pages 392-396

Simple and accurate spectra normalization in ion beam analysis using a transmission mesh-based charge integration

Author keywords

Beam charge normalization; Elastic recoil detection analysis (ERDA); Ion implantation; Rutherford backscattering spectroscopy (RBS)

Indexed keywords

CHARGE CARRIERS; ION IMPLANTATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY;

EID: 30844464826     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.09.002     Document Type: Article
Times cited : (18)

References (10)
  • 8
    • 30844447018 scopus 로고    scopus 로고
    • SRIM program
    • J.F. Ziegler, SRIM program. Available from: < http://www.srim.org/ >.
    • Ziegler, J.F.1
  • 10
    • 30844458896 scopus 로고    scopus 로고
    • AIP Conf. Proc. 680 (1) (2003) 482.
    • (2003) AIP Conf. Proc. , vol.680 , Issue.1 , pp. 482


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.