Electronic properties of the Sm/4H-SiC surface alloy

Journal of Applied Physics

Volumn 99, Issue 1, 2006, Pages

  Kildemo, M ^a   Grossner, U ^b   Juel, M ^a   Samuelsen, B ^a   Svensson, B G ^b   Raaen, S ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b UNIVERSITY OF OSLO   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

FLATBAND VOLTAGES; ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY; VALENCY; X-RAY PHOTOEMISSION SPECTROSCOPY;

ANNEALING; ELECTRIC POTENTIAL; EMISSION SPECTROSCOPY; MONOLAYERS; SILICON CARBIDE; ULTRAHIGH VACUUM; ULTRAVIOLET DEVICES;

SAMARIUM;

EID: 30844440764     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2150588     Document Type: Article

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