Mueller matrix determination for one-dimensional rough surfaces: Four reduced measurement equivalent sets

Optics Communications

Volumn 259, Issue 1, 2006, Pages 60-63

  Espinosa Luna, Rafael ^a   Mendoza Suárez, Alberto ^b   Atondo Rubio, Gelacio ^c   Hinojosa, S ^a,d   Rivera Vázquez, J Octavio ^a   Guillén Bonilla, J Trinidad ^a  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b UNIVERSIDAD MICHOACANA DE SAN NICOLÁS DE HIDALGO   (Mexico)

^c UNIVERSIDAD AUTÓNOMA DE SINALOA   (Mexico)

^d UNIVERSIDAD AUTÓNOMA DE ZACATECAS   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; LIGHT SCATTERING; SURFACE ROUGHNESS; VECTORS;

MUELLER MATRIX (MM); PLANE-OF-INCIDENCE;

MATRIX ALGEBRA;

EID: 30744470140     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.08.039     Document Type: Article

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