Remote two-dimensional imaging of giant magnetoresistance with spatial resolution

Applied Physics Letters

Volumn 88, Issue 2, 2006, Pages 1-3

  Stirk, S M ^a   Thompson, S M ^a   Mennicke, R T ^a   Matthew, J A D ^a   Lee, A F ^a  

^a UNIVERSITY OF YORK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; MAGNETIC FIELDS; MAGNETIC RESONANCE IMAGING;

COFECU WAFER; EMISSIVITY; GMR MATERIALS; SPATIAL RESOLUTION;

MAGNETORESISTANCE;

EID: 30744449485     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2158152     Document Type: Article

References (5)

1. S. M. Stirk, S. M. Thompson, and J. A. D. Matthew, Appl. Phys. Lett. 86, 102505 (2005).
2. A. V. Sokolov, Optical Properties of Metals (Blackie, Glasgow, 1967).
3. R. J. Baxter, D. G. Pettifor, E. Y. Tsymbal, D. Bozec, J. A. D. Matthew, and S. M. Thompson, J. Phys.: Condens. Matter 15, L695 (2003).
4. M. Vopsaroiu, D. Bozec, J. A. D. Matthew, S. M. Thompson, C. H. Marrows, and M. Perez, Phys. Rev. B 70, 214423 (2004).
5. R. T. Mennicke, D. Bozec, V. G. Kravets, M. Vopsaroiu, J. A. D. Matthew, and S. M. Thompson, J. Magn. Magn. Mater. (in press), available online via Science Direct. 0304-8853 10.1016/j.jmmm.2005.10.233