Contactless magnetoresistance studies of Co/Cu multilayers using the infrared magnetorefractive effect

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 21, 2004, Pages 1-7

  Vopsaroiu, M ^a   Bozec, D ^a   Matthew, J A D ^a   Thompson, S M ^a   Marrows, C H ^b   Perez, M ^b,c  

^a UNIVERSITY OF YORK   (United Kingdom)

^b UNIVERSITY OF LEEDS   (United Kingdom)

^c Oxford Applied Research   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; COPPER;

ARTICLE; CURVE FITTING; DIELECTRIC CONSTANT; ELECTROMAGNETIC RADIATION; INFRARED RADIATION; MAGNETIC FIELD; MATHEMATICAL ANALYSIS; REFLECTOMETRY; SPECTRAL SENSITIVITY;

EID: 13844281032     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.214423     Document Type: Article

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