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Volumn 40, Issue 24, 2005, Pages 6453-6458

Studies on growth mechanism of HgCdTe epilayer on Si grown by HWE

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL LATTICES; CRYSTAL ORIENTATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GROWTH KINETICS; HETEROJUNCTIONS; SILICON; X RAY DIFFRACTION;

EID: 30744443498     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-005-1710-8     Document Type: Article
Times cited : (3)

References (9)
  • 1
    • 0030367639 scopus 로고    scopus 로고
    • S. BERNARDI, SPIE 2816 (1996) 2.
    • (1996) SPIE , vol.2816 , pp. 2
    • Bernardi, S.1
  • 4
    • 85081439928 scopus 로고
    • JCPDS-International Centre for Diffraction Data, Pennsylvania, (150770) and (320665)
    • SWARTHMORE, in "Powder Diffraction File. Inorganic and Organic" (JCPDS-International Centre for Diffraction Data, Pennsylvania, 1974) (150770) and (320665).
    • (1974) Powder Diffraction File. Inorganic and Organic
    • Swarthmore1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.