Noise, resolution and entropy in sputter profiling

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 354, Issue 1719, 1996, Pages 2713-2729

  Dowsett, M G ^a   Collins, R ^b  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b UNIVERSITY OF YORK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3042929901     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.1996.0125     Document Type: Article

References (33)

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