Comparison of recrystallisation kinetics determined by stress relaxation, double hit, optical metallography and EBSD approaches

Materials Characterization

Volumn 52, Issue 2, 2004, Pages 93-102

  Dzubinsky M ^a   Husain, Z ^b   Van Haaften, W M ^c  

^a INSTITUTE OF CHEMISTRY   (Slovakia)

^b SWINDEN TECHNOLOGY CENTRE   (Netherlands)

^c Delft University of Technology Corus Research Development and Technology   (Netherlands)

Author keywords

Double hit; EBSD; Optical metallography; Recrystallisation kinetics; Stress relaxation

Indexed keywords

AUSTENITE; BACKSCATTERING; ELECTRON DIFFRACTION; METALLOGRAPHIC MICROSTRUCTURE; METALLOGRAPHY; OPTICAL MICROSCOPY; OPTICAL SYSTEMS; STRESS RELAXATION;

DOUBLE HIT; ELECTRON BACKSCATTERED DIFFRACTION (EBSD); OPTICAL METALLOGRAPHY; RECRYSTALLIZATION KINETICS;

RECRYSTALLIZATION (METALLURGY);

EID: 3042829678     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2004.03.006     Document Type: Article

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