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Volumn 43, Issue 4 B, 2004, Pages
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Sample-and-hold imaging for fast scanning in atomic force microscopy
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Author keywords
Atomic force microscopy; Fast imaging; Quality factor; Sample and hold circuit
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
IMAGE SENSORS;
OPTICAL MICROSCOPY;
SCANNING;
TOPOLOGY;
VIBRATION MEASUREMENT;
CANTILEVER DEFLECTION SIGNALS;
CONTACT MODE;
SCANNING NEAR-FIELD MICROSCOPY;
IMAGING TECHNIQUES;
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EID: 3042799699
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.43.l582 Document Type: Article |
Times cited : (6)
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References (5)
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