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Volumn 43, Issue 4 B, 2004, Pages

Sample-and-hold imaging for fast scanning in atomic force microscopy

Author keywords

Atomic force microscopy; Fast imaging; Quality factor; Sample and hold circuit

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE SENSORS; OPTICAL MICROSCOPY; SCANNING; TOPOLOGY; VIBRATION MEASUREMENT;

EID: 3042799699     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.43.l582     Document Type: Article
Times cited : (6)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.