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Volumn 13, Issue 2 I, 2003, Pages 219-222

Multi channel high-Tc scanning SQUID microscope

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; FEEDBACK CONTROL; HIGH TEMPERATURE SUPERCONDUCTORS; IMAGING SYSTEMS; MAGNETIC FIELD EFFECTS; MAGNETIC FLUX; MICROSCOPES; SCANNING;

EID: 0043281590     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.813689     Document Type: Conference Paper
Times cited : (4)

References (9)
  • 1
    • 0002975339 scopus 로고    scopus 로고
    • SQUID fundamentals
    • H. Weinstock, Ed. Dordrecht, The Netherlands: Kluwer Academic Publishers
    • J. Clarke, "SQUID fundamentals," in SQUID Sensors: Fundamentals, Fabrication and Applications, H. Weinstock, Ed. Dordrecht, The Netherlands: Kluwer Academic Publishers, 1996, pp. 1-62.
    • (1996) SQUID Sensors: Fundamentals, Fabrication and Applications , pp. 1-62
    • Clarke, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.