Determination of film thickness and refractive index by interferometry

Polymer Testing

Volumn 23, Issue 6, 2004, Pages 695-702

  Shabana, H M ^a,b  

^a Mansoura University   (Egypt)

^b The Public Authority for Applied Education and Training   (Kuwait)

Author keywords

Interferometry; Michelson interferometer; Polypropylene film; Refractive index; Two beam Pluta microscope

Indexed keywords

COPOLYMERS; HEAT TREATMENT; INTERFEROMETRY; LIGHT PROPAGATION; LIGHT SOURCES; OPTICAL FIBER FABRICATION; OPTICAL FIBERS; OPTICAL WAVEGUIDES; POLYPROPYLENES; SPECTROPHOTOMETERS; SUBSTRATES;

AIR WEDGE INTERFERENCE; FILM THICKNESS; MICHELSON INTERFEROMETER; TWO-BEAM PLUTA MICROSCOPE;

REFRACTIVE INDEX;

EID: 3042733776     PISSN: 01429418     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymertesting.2004.01.006     Document Type: Article

References (17)

1. Barakat N., Hamza A.A. Interferometry of Fibrous Materials, Hilger Bristol. 1990.
2. Fouda I.M., Shabana H.M. J. Phys. Condens. Matter. 11:1999;3371.
3. Fouda I.M., Shabana H.M. J Appl. Polym. Sci. 82:2001;2387.
4. Pluta M. Optica Applicata. 16:1986;301.
5. Pluta M. Optica Applicata. 17:1987;47.
6. Matsuo H., Hno K., Kondo M. J. Appl. Polym. Sci. 7:1963;1833.
7. Harrick N.J. Appl. Optics. 10:1971;2344.
8. Goodman A.M. Appl. Optics. 17:1978;2779.
9. Hernandez M., Juarez A., Hernandez R. Superficies Vacio. 9:1999;283.
10. Nasr A.M., Sadik A.M. J. Opt. A Pure Appl. Opt. 3:2001;200.
11. A.A. Hamza, M.A. Mabrouk, W.A. Ramadan, A.M. Emara, Opt. Comm. 225 (2003) 341.
12. Jenkins F.A., White H.E. Fundamentals of Optics. 1950;McGraw-Hill, New York.
13. Instruction Manual and Experimental Guide for the Pasco Scientific Model OS-9255 thru 9528, USA, 1990.
14. Hamza A.A. J. Microsc. 142:1986;35.
15. Pluta M. Optica Acta. 18:1971;661.
16. Pluta M. J. Microsc. 96:1972;309.
17. Faust R.C. Proc. Phys. Soc. B. 68:1955;1081.