Primary study on the contact degradation mechanism of CdZnTe detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 527, Issue 3, 2004, Pages 487-492

  Sang, Wenbin ^a   Wei, Jin ^a   Qi, Zhang ^a   Wanwan, Li ^a   Jiahua, Min ^a   Jianyong, Teng ^a   Yongbiao, Qian ^a  

^a SHANGHAI UNIVERSITY   (China)

Author keywords

Cadmium zinc telluride; Degradation; Electrical contacts; Gamma ray detectors

Indexed keywords

CADMIUM COMPOUNDS; COMPUTER SIMULATION; DEGRADATION; DIFFUSION; ELECTRIC CONTACTS; ELECTRODES; FINITE ELEMENT METHOD; GAMMA RAYS;

CADMIUM ZINC TELLURIDE; CONTACT LAYERS; GAMMA-RAY DETECTORS;

NUCLEAR INSTRUMENTATION;

EID: 3042731550     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2004.03.200     Document Type: Article

References (7)

1. Niraula M., Nakamura A., Aoki T., et al. Nucl. Instr. and Meth. Phys. Res. A. 491:2002;168.
2. W. Murray, K. Krueger, M.W. Rawool-Sullivan, et al., IEEE Nuclear Science Symposium and Medical Imaging Conference, Vol. 1, 1999, pp. 643-645.
3. Burger A., Chen H., et al. IEEE Trans. Nucl. Sci. NS-44(3):1997;934.
4. Darmadasa I.M. Prog. Cryst. Growth Charact. 36(4):1998;249.
5. Egarievwe S.U., Chen K.-T., Burger A., James R.B., et al. J. X-ray Sci. Technol. 6(4):1996;309.
6. Li W., Sang W., Min J., et al. Semiconduct. Sci. Technol. 17(10):2002;L55.
7. Wang L., Sang W., Shi W., et al. Nucl. Instr. and Meth. Phys. Res. A. 448:2000;581.