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Volumn 39, Issue 12, 2004, Pages 3913-3925
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Reliability of the diffusion-multiple approach for phase diagram mapping
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Author keywords
[No Author keywords available]
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Indexed keywords
BACKSCATTERING;
DIFFUSION;
ELECTRON DIFFRACTION;
IMPURITIES;
INTERDIFFUSION (SOLIDS);
MICROANALYSIS;
PHASE DIAGRAMS;
PHASE EQUILIBRIA;
RELIABILITY;
THERMAL EFFECTS;
CONTINUOUS PHASE DIAGRAMMING (CPD);
ELECTRON PROBE MICROANALYSIS;
METASTABLE PHASES;
MICROPROBES;
TERNARY SYSTEMS;
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EID: 3042714567
PISSN: 00222461
EISSN: None
Source Type: Journal
DOI: 10.1023/B:JMSC.0000031472.25241.c5 Document Type: Article |
Times cited : (82)
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References (36)
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