Determination of the Nb-Cr-Si phase diagram using diffusion multiples

Acta Materialia

Volumn 51, Issue 20, 2003, Pages 6395-6405

  Zhao, J C ^a   Jackson, M R ^a   Peluso, L A ^a  

^a GE GLOBAL RESEARCH   (United States)

Author keywords

Diffusion multiple; Laves phase; Nb Cr Si; Phase diagram; Silicide

Indexed keywords

DIFFUSION; JET ENGINES; MICROANALYSIS; NIOBIUM COMPOUNDS; OXIDATION RESISTANCE; PHASE DIAGRAMS; SCANNING ELECTRON MICROSCOPY; SUPERALLOYS;

DIFFUSION MULTIPLES; ELECTRON PROBE MICROANALYSIS (EPMA);

TERNARY SYSTEMS;

EID: 0242607825     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2003.08.007     Document Type: Article

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