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Volumn 52, Issue 13, 2004, Pages 3959-3966

Buckling and post-buckling of stressed straight-sided wrinkles: Experimental AFM observations of bubbles formation and finite element simulations

Author keywords

Atomic force microscopy; Buckling; Finite element analysis; Simulation; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; BUCKLING; FINITE ELEMENT METHOD; ION BEAMS; MULTILAYERS; NICKEL; NUMERICAL ANALYSIS; POISSON RATIO; POLYCARBONATES; RESIDUAL STRESSES; SPUTTERING; STRESS RELAXATION; STRESSES; SUBSTRATES; THIN FILMS; WRINKLE RECOVERY;

EID: 3042708621     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2004.05.011     Document Type: Article
Times cited : (45)

References (33)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.