In situ accelerated leaching of cement paste by application of electrical fields monitored by synchrotron X-ray diffraction

Applied Physics A: Materials Science and Processing

Volumn 79, Issue 3, 2004, Pages 661-669

  Castellote, M ^a   Turrillas, X ^a   Andrade, C ^a   Alonso, C ^a   Rodriguez, M A ^b   Kvick, A ^c  

^a INSTITUTO DE CIENCIAS DE LA CONSTRUCCIÓN EDUARDO TORROJA   (Spain)

^b INSTITUTO DE CERÁMICA Y VIDRIO   (Spain)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION MEASUREMENT; ADHESIVE PASTES; CEMENTS; COMPUTER SIMULATION; DEGRADATION; DISSOLUTION; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; MICROSTRUCTURE; PRECIPITATION (CHEMICAL); SYNCHROTRONS; X RAY DIFFRACTION ANALYSIS;

CEMENT PASTE; DIFFRACTION PATTERNS; ELECTRICAL TREATMENT; IN SITU ACCELERATED LEACHING;

LEACHING;

EID: 3042689316     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-003-2076-x     Document Type: Article

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