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Material characterization by line-focus-beam acoustic microscope
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Kushibiki, J.1
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0036012875
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Development of the line-focus-beam ultrasonic material characterization system
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J. Kushibiki, Y. Ono, Y. Ohashi, and M. Arakawa, "Development of the line-focus-beam ultrasonic material characterization system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 49, pp. 99-113, Jan. 2002.
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0036525630
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3 single crystals for SAW devices using the LFB ultrasonic material characterization system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 49, pp. 454-465, Apr. 2002.
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0034228746
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3 substrates for SAW devices by the LFB ultrasonic material characterization system
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3 substrates for SAW devices by the LFB ultrasonic material characterization system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 47, pp. 1068-1076, July 2000.
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3 single crystals by the LFB ultrasonic material characterization system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 49, pp. 905-914, July 2002.
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A method for calibrating the line-focus-beam acoustic microscopy system
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J. Kushibiki and M. Arakawa, "A method for calibrating the line-focus-beam acoustic microscopy system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 45, pp. 421-430, Mar. 1998.
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Kushibiki, J.1
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14
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0034226638
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Experimental study of construction mechanism of V(z) curves obtained by line-focus-beam acoustic microscopy
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July
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Y. Ono and J. Kushibiki, "Experimental study of construction mechanism of V(z) curves obtained by line-focus-beam acoustic microscopy," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 47, pp. 1042-1050, July 2000.
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Ono, Y.1
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High-accuracy standard specimens for the line-focus-beam ultrasonic material characterization system
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June
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J. Kushibiki, M. Arakawa, and R. Okabe, "High-accuracy standard specimens for the line-focus-beam ultrasonic material characterization system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 49, pp. 827-835, June 2002.
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16
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0023548783
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Determination of elastic constants by LFB acoustic microscope
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Cut-off characteristics of leaky Sezawa and pseudo-Sezawa wave modes for thin-film characterization
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J. Kushibiki, T. Ishikawa, and N. Chubachi, "Cut-off characteristics of leaky Sezawa and pseudo-Sezawa wave modes for thin-film characterization, " Appl. Phys. Lett., vol. 57, pp. 1967-1969, Nov. 1990.
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Elastic constant measurement by using line-focus-beam acoustic microscope
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Mihara, T.1
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Elastic constants of single-crystal transition-metal nitride films measured by line-focus acoustic microscopy
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Sep.
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J. O. Kim, J. D. Achenbach, P. B. Mirkarimi, M. Shinn, and S. A. Barnett, "Elastic constants of single-crystal transition-metal nitride films measured by line-focus acoustic microscopy," J. Appl. Phys., vol. 72, pp. 1805-1811, Sep. 1992.
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Acoustic microscopy measurement of elastic constants and mass density
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A method of determining acoustical physical constants for piezoelectric materials by line-focus-beam acoustic microscopy
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July
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I. Takanaga and J. Kushibiki, "A method of determining acoustical physical constants for piezoelectric materials by line-focus-beam acoustic microscopy," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 49, pp. 893-904, July 2002.
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0033875045
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Influence of reflected waves from the back surface of thin solid-plate specimen on velocity measurements by line-focus-beam acoustic microscopy
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Jan.
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J. Kushibiki, Y. Ohashi, and M. Arakawa, "Influence of reflected waves from the back surface of thin solid-plate specimen on velocity measurements by line-focus-beam acoustic microscopy," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 47, pp. 274-284, Jan. 2000.
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3 for high performance resonators and filters
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3 for high performance resonators and filters," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 48, pp. 1442-1448, Sep. 2001.
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Multimode interference mechanism in V(z) curves obtained by acoustic line-focus-beam
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