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Volumn 21, Issue 3, 2002, Pages 191-198

Topological localisation of defects at atomic scale

Author keywords

Defects; Eulcr Poincarc characteristic; HREM images; Interfaces; Tessellations; Topology

Indexed keywords


EID: 3042605144     PISSN: 15803139     EISSN: 18545165     Source Type: Journal    
DOI: 10.5566/ias.v21.p191-198     Document Type: Article
Times cited : (1)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.