-
1
-
-
84977254654
-
Growth of piezoelectric and ferroelectric materials by the Czochralski technique
-
Feb.
-
A. A. Ballman, "Growth of piezoelectric and ferroelectric materials by the Czochralski technique." J. Amer. Ceram. Soc., vol. 48, pp. 112-113, Feb. 1965.
-
(1965)
J. Amer. Ceram. Soc.
, vol.48
, pp. 112-113
-
-
Ballman, A.A.1
-
3
-
-
0016953294
-
Surface-acoustic-wave devices for communications
-
May
-
R. M. Hays and C. S. Hartmann, "Surface-acoustic-wave devices for communications," Proc. IEEE, vol. 64, pp. 652-671, May 1976.
-
(1976)
Proc. IEEE
, vol.64
, pp. 652-671
-
-
Hays, R.M.1
Hartmann, C.S.2
-
4
-
-
0027660084
-
SAW devices for consumer communication applications
-
Sep.
-
C. C. W. Ruppel, R. Dill, A. Fischerauer, G. Fischerauer, W. Gawlik, J. Machui, F. Müller, L. Reindl, W. Ruile, G. Scholl, I. Schropp, and K. C. Wagner, "SAW devices for consumer communication applications." IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 40, pp. 438-452, Sep. 1993.
-
(1993)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.40
, pp. 438-452
-
-
Ruppel, C.C.W.1
Dill, R.2
Fischerauer, A.3
Fischerauer, G.4
Gawlik, W.5
Machui, J.6
Müller, F.7
Reindl, L.8
Ruile, W.9
Scholl, G.10
Schropp, I.11
Wagner, K.C.12
-
5
-
-
0006240046
-
Surface acoustic wave devices
-
Dec.
-
K. Yamanouchi, "Surface acoustic wave devices," IEICE Trans. Electron., vol. J82-C-I, pp. 689-696, Dec. 1999.
-
(1999)
IEICE Trans. Electron.
, vol.J82-C-I
, pp. 689-696
-
-
Yamanouchi, K.1
-
6
-
-
0001679109
-
Lithium tantalate single crystal stoichiometry
-
R. L. Barns and J. R. Carruthers, "Lithium tantalate single crystal stoichiometry." J. Appl. Crystallogr., vol. 3, pp. 395-399, 1970.
-
(1970)
J. Appl. Crystallogr.
, vol.3
, pp. 395-399
-
-
Barns, R.L.1
Carruthers, J.R.2
-
7
-
-
49649155661
-
Congruent melting composition of lithium metatantalate
-
Aug.
-
S. Miyazawa and H. Iwasaki, "Congruent melting composition of lithium metatantalate." J. Cryst. Growth, vol. 10. pp. 276-278, Aug. 1971.
-
(1971)
J. Cryst. Growth
, vol.10
, pp. 276-278
-
-
Miyazawa, S.1
Iwasaki, H.2
-
12
-
-
0000898449
-
3 substrates
-
3 substrates," Jpn. J. Appl. Phys., vol. 28, no. Suppl. 28-1, pp. 111-113, 1989.
-
(1989)
Jpn. J. Appl. Phys.
, vol.28
, Issue.SUPPL. 28-1
, pp. 111-113
-
-
Sato, M.1
Iwama, A.2
Yamada, J.3
Hikita, M.4
Furukawa, Y.5
-
13
-
-
0029219028
-
3 wafers by line-focus-beam acoustic microscopy
-
Jan.
-
3 wafers by line-focus-beam acoustic microscopy," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 42, pp. 83-90, Jan. 1995.
-
(1995)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.42
, pp. 83-90
-
-
Kushibiki, J.1
Ishiji, H.2
Kobayashi, T.3
Chubachi, N.4
Sahashi, I.5
Sasamata, T.6
-
15
-
-
0000778051
-
3 single crystals
-
May
-
3 single crystals," J. Appl. Phys., vol. 87, pp. 4395-4403, May 2000.
-
(2000)
J. Appl. Phys.
, vol.87
, pp. 4395-4403
-
-
Kushibiki, J.1
Okuzawa, T.2
Hirohashi, J.3
Ohashi, Y.4
-
16
-
-
0034228746
-
3 substrates for SAW devices by the LFB ultrasonic material characterization system
-
July
-
3 substrates for SAW devices by the LFB ultrasonic material characterization system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 47, pp. 1068-1076, July 2000.
-
(2000)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.47
, pp. 1068-1076
-
-
Kushibiki, J.1
Ohashi, Y.2
Ono, Y.3
-
17
-
-
0036525630
-
3 single crystals for SAW devices using the LFB ultrasonic material characterization system
-
Apr.
-
3 single crystals for SAW devices using the LFB ultrasonic material characterization system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 49, pp. 454-465, Apr. 2002.
-
(2002)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.49
, pp. 454-465
-
-
Kushibiki, J.1
Ohashi, Y.2
Ujiie, T.3
-
18
-
-
0022027260
-
Material characterization by line-focus-beam acoustic microscope
-
Mar.
-
J. Kushibiki and N. Chubachi, "Material characterization by line-focus-beam acoustic microscope," IEEE Trans. Sonics Ultrason., vol. SU-32, pp. 189-212, Mar. 1985.
-
(1985)
IEEE Trans. Sonics Ultrason.
, vol.SU-32
, pp. 189-212
-
-
Kushibiki, J.1
Chubachi, N.2
-
19
-
-
0036012875
-
Development of the line-focus-beam ultrasonic material characterization system
-
Jan.
-
J. Kushibiki, Y. Ono, Y. Ohashi, and M. Arakawa, "Development of the line-focus-beam ultrasonic material characterization system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 49. pp. 99-113, Jan. 2002.
-
(2002)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.49
, pp. 99-113
-
-
Kushibiki, J.1
Ono, Y.2
Ohashi, Y.3
Arakawa, M.4
-
20
-
-
0032014405
-
A method for calibrating the line-focus-beam acoustic microscopy system
-
Mar.
-
J. Kushibiki and M. Arakawa, "A method for calibrating the line-focus-beam acoustic microscopy system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 45, pp. 421-430, Mar. 1998.
-
(1998)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.45
, pp. 421-430
-
-
Kushibiki, J.1
Arakawa, M.2
-
21
-
-
0036591398
-
High-accuracy standard specimens for the line-focus-beam, ultrasonic material characterization system
-
June
-
J. Kushibiki, M. Arakawa, and R. Okabe, "High-accuracy standard specimens for the line-focus-beam, ultrasonic material characterization system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 49, pp. 827-835, June 2002.
-
(2002)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.49
, pp. 827-835
-
-
Kushibiki, J.1
Arakawa, M.2
Okabe, R.3
-
22
-
-
0000422146
-
3 crystals by line-focus-beam acoustic microscopy
-
Mar.
-
3 crystals by line-focus-beam acoustic microscopy," Appl. Phys. Lett., vol. 58, pp. 893-895, Mar. 1991.
-
(1991)
Appl. Phys. Lett.
, vol.58
, pp. 893-895
-
-
Kushibiki, J.1
Takahashi, H.2
Kobayashi, T.3
Chubachi, N.4
-
23
-
-
0000422147
-
3 crystals by line-focus-beam acoustic microscopy
-
June
-
3 crystals by line-focus-beam acoustic microscopy," Appl. Phys. Lett., vol. 58, pp. 2622-2624, June 1991.
-
(1991)
Appl. Phys. Lett.
, vol.58
, pp. 2622-2624
-
-
Kushibiki, J.1
Takahashi, H.2
Kobayashi, T.3
Chubachi, N.4
-
24
-
-
0000911121
-
3 crystals measured by line-focus-beam acoustic microscopy
-
Nov.
-
3 crystals measured by line-focus-beam acoustic microscopy," Appl. Phys. Lett., vol. 61, pp. 2164-2166, Nov. 1992.
-
(1992)
Appl. Phys. Lett.
, vol.61
, pp. 2164-2166
-
-
Kushibiki, J.1
Kobayashi, T.2
Ishiji, H.3
Chubachi, N.4
-
25
-
-
0032615130
-
3 single crystals measured by line-focus-beam acoustic microscopy
-
June
-
3 single crystals measured by line-focus-beam acoustic microscopy," J. Appl. Phys., vol. 85, pp. 7863-7868, June 1999.
-
(1999)
J. Appl. Phys.
, vol.85
, pp. 7863-7868
-
-
Kushibiki, J.1
Kobayashi, T.2
Ishiji, H.3
Jen, C.K.4
-
26
-
-
0036628591
-
3 single crystals by the LFB ultrasonic material characterization system
-
July
-
3 single crystals by the LFB ultrasonic material characterization system," IEEE Trans. Ultrason., Ferroelect., Freg. Contr., vol. 49, pp. 905-914, July 2002.
-
(2002)
IEEE Trans. Ultrason., Ferroelect., Freg. Contr.
, vol.49
, pp. 905-914
-
-
Kushibiki, J.1
Ohashi, Y.2
Ono, Y.3
Sasamata, T.4
-
27
-
-
0037925613
-
3 single crystals by the LFB ultrasonic material characterization system
-
May
-
3 single crystals by the LFB ultrasonic material characterization system," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 50, pp. 544-552, May 2003.
-
(2003)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.50
, pp. 544-552
-
-
Kushibiki, J.1
Ohashi, Y.2
Mishima, N.3
-
28
-
-
0033277021
-
3 single crystals
-
Sep.
-
3 single crystals," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 46, pp. 1315-1323, Sep. 1999.
-
(1999)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.46
, pp. 1315-1323
-
-
Kushibiki, J.1
Takanaga, I.2
Arakawa, M.3
Sannomiya, T.4
-
29
-
-
0037095293
-
3 single crystals
-
May
-
3 single crystals," J. Appl. Phys., vol. 91, pp. 6341-6349, May 2002.
-
(2002)
J. Appl. Phys.
, vol.91
, pp. 6341-6349
-
-
Kushibiki, J.1
Takanaga, I.2
Komatsuzaki, S.3
Ujiie, T.4
-
30
-
-
0033875045
-
Influence of reflected waves from the back surface of thin solid-plate specimen on velocity measurements by line-focus-beam acoustic microscopy
-
Jan.
-
J. Kushibiki, Y. Ohashi, and M. Arakawa, "Influence of reflected waves from the back surface of thin solid-plate specimen on velocity measurements by line-focus-beam acoustic microscopy," IEEE Trans. Ultrason., Ferroelect., Freg. Contr., vol. 47, pp. 274-284, Jan. 2000.
-
(2000)
IEEE Trans. Ultrason., Ferroelect., Freg. Contr.
, vol.47
, pp. 274-284
-
-
Kushibiki, J.1
Ohashi, Y.2
Arakawa, M.3
-
32
-
-
0035437742
-
3 for high performance resonators and filters
-
Sep.
-
3 for high performance resonators and filters," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 48, pp. 1442-1448, Sep. 2001.
-
(2001)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.48
, pp. 1442-1448
-
-
Kawachi, O.1
Mineyoshi, S.2
Endoh, G.3
Ueda, M.4
Ikata, O.5
Hashimoto, K.6
Yamaguchi, M.7
-
33
-
-
0038695476
-
Differential thermal analysis
-
Apr.
-
C. B. Murphy, "Differential thermal analysis," Anal. Chem., vol. 30, pp. 867-872, Apr. 1958.
-
(1958)
Anal. Chem.
, vol.30
, pp. 867-872
-
-
Murphy, C.B.1
-
34
-
-
0014765708
-
Propagation of surface waves at the boundary between a piezoelectric crystal and a fluid medium
-
Apr.
-
J. J. Campbell and W. R. Jones, "Propagation of surface waves at the boundary between a piezoelectric crystal and a fluid medium," IEEE Trans. Sonics Ultrason., vol. SU-17, pp. 71-76, Apr. 1970.
-
(1970)
IEEE Trans. Sonics Ultrason.
, vol.SU-17
, pp. 71-76
-
-
Campbell, J.J.1
Jones, W.R.2
-
35
-
-
0001056721
-
Crystals for quartz resonators
-
Jan.
-
J. C. Brice, "Crystals for quartz resonators," Rev. Modern Phys., vol. 57, pp. 105-146, Jan. 1985.
-
(1985)
Rev. Modern Phys.
, vol.57
, pp. 105-146
-
-
Brice, J.C.1
-
36
-
-
0036012878
-
Accurate measurements of the acoustical physical constants of synthetic α-quartz for SAW devices
-
Jan.
-
J. Kushibiki, I. Takanaga, and S. Nishiyama, "Accurate measurements of the acoustical physical constants of synthetic α-quartz for SAW devices," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 49, pp. 125-135, Jan. 2002.
-
(2002)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.49
, pp. 125-135
-
-
Kushibiki, J.1
Takanaga, I.2
Nishiyama, S.3
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