PMOS NBTI-induced circuit mismatch in advanced technologies

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2004, Pages 171-175

  Agostinelli, M ^a   Lau, S ^a   Pae, S ^a   Marzolf, P ^a   Muthali, H ^a   Jacobs, S ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT THEORY; ELECTRIC FIELD EFFECTS; GATES (TRANSISTOR); INTERFACES (MATERIALS); RELIABILITY THEORY; THERMAL EFFECTS; THERMODYNAMIC STABILITY;

CIRCUIT MISMATCH; NEGATIVE BIAS TEMPERATURE INSTABILITY (NBTI); PMOS TRANSISTORS;

CMOS INTEGRATED CIRCUITS;

EID: 3042561384     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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